Applications that Facilitate the Proactive Outlook For Im-Chips

Miryala Mounika, P.V.Vara Prasad Rao


These designs pose significant challenges towards the funnel management plan, flow, and tools. This paper introduces several test logic architectures that facilitate preemptive test scheduling for SC circuits with embedded deterministic test-based test data compression. This paper presents several techniques used to resolve problems surfacing when using scan bandwidth management to large industrial multicore system-on-nick (SC) designs with embedded test data compression. Exactly the same solutions allow efficient handling of physical constraints in realistic programs. Finally, condition-of-the-art SC test scheduling calculations are architected accordingly by looking into making provisions for: 1) establishing time-effective test designs 2) optimization of SC pin partitions 3) allocation of core-level channels according to scan data volume and 4) more flexible core-wise use of automatic test equipment funnel sources. An in depth situation study is highlighted herein with a number of experiments permitting someone to learn to compromise different architectures and test-related factors

Full Text:



  • There are currently no refbacks.

Copyright (c) 2016 Edupedia Publications Pvt Ltd

Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.


EduPedia Publications Pvt Ltd, D-351, Prem Nagar-2, Suleman Nagar, Kirari, Nagloi, New Delhi PIN-Code 110086, India Through Phone Call us now: +919958037887 or +919557022047

All published Articles are Open Access at

Paper submission: or


Mobile:                  +919557022047 & +919958037887


Journals Maintained and Hosted by

EduPedia Publications (P) Ltd in Association with Other Institutional Partners

Pen2Print and IJR are registered trademark of the Edupedia Publications Pvt Ltd.